Pitfalls In Diagnostic Cytopathology | With Key D...

"Pitfalls in Diagnostic Cytopathology With Key Differentiating Cytologic Features," published by Springer in 2016, is a practical guide by Von G. Samedi and Thèrése Bocklage designed to help cytopathologists distinguish benign mimics from malignant cells. The text utilizes organ-specific, high-yield diagnostic criteria and visual aids to minimize false-positive diagnoses caused by reactive changes and sampling errors. For more details, visit Springer .